Open AccessDeep-learning-based nanowire detection in AFM images for automated nanomanipulation
Author(s) -
Huitian Bai,
Sen Wu
Publication year - 2021
Publication title -
nanotechnology and precision engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.232
H-Index - 12
eISSN - 2589-5540
pISSN - 1672-6030
DOI - 10.1063/10.0003218
Subject(s) - robustness (evolution) , nanowire , computer science , deep learning , segmentation , atomic force microscopy , artificial intelligence , nanometre , nanotechnology , image segmentation , materials science , convolutional neural network , abstraction , computer vision , biochemistry , chemistry , philosophy , epistemology , composite material , gene
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom