Open AccessErratum: Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained‐layer heterostructures [Appl. Phys. Lett. 47, 322 (1985)]
Author(s) -
R. People,
J. C. Bean
Publication year - 1986
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.97637
Subject(s) - heterojunction , materials science , layer (electronics) , condensed matter physics , lattice (music) , optoelectronics , nanotechnology , physics , acoustics
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