Sensitive i n s i t u trace-gas detection by photothermal deflection spectroscopy
Author(s) -
D. Fournier,
A. C. Boccara,
Nabil M. Amer,
Robert W Gerlach
Publication year - 1980
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.91970
Subject(s) - photothermal therapy , analytical chemistry (journal) , limiting , spectroscopy , trace gas , absorption spectroscopy , deflection (physics) , chemistry , photothermal spectroscopy , optics , materials science , physics , chromatography , mechanical engineering , organic chemistry , quantum mechanics , engineering
We present a sensitive (5 ppb ethylene, 10{sup -7} cm{sup −1) and simple photothermal scheme for the detection of trace gases and measuring weak absorptions in gas phase samples. We also demonstrate the feasibility of this scheme for performing in situ measurements in the absence of sample cells or containers, thus eliminating the drawbacks of sampling and sampling techniques. Factors limiting our detectivity are discussed, and a comparison to the thermal lens effect is made
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