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Development of nanometer resolution C-band radio frequency beam position monitors in the final focus test-beam
Author(s) -
G. Mazaheri,
T. Slaton,
T. Shintake
Publication year - 1998
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.57021
Subject(s) - beam (structure) , nanometre , focus (optics) , radio frequency , resolution (logic) , position (finance) , optics , high resolution , physics , materials science , electrical engineering , computer science , engineering , remote sensing , geology , finance , artificial intelligence , economics
Using a 47 GeV electron beam, the Final Focus Test Beam (FFTB) produces vertical spot sizes around 70 nm. These small beam sizes introduce an excellent opportunity to develop and test high resolution Radio Frequency Beam Position Monitors (RF-BPMs). These BPMs are designed to measure pulse to pulse beam motion (jitter) at a theoretical resolution of approximately 1 nm. The beam induces a TM110 mode with an amplitude linearly proportional to its charge and displacement from the BPM’s (cylindrical cavity) axis. The C-band (5712 MHz) TM110 signal is processed and converted into beam position for use by the Stanford Linear Collider (SLC) control system. Presented are the experimental procedures, acquisition, and analysis of data demonstrating resolution of jitter near 25 nm. With the design of future e+e− linear colliders requiring spot sizes close to 3 nm, understanding and developing RF-BPMs will be essential in resolving and controlling jitter.

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