First multi-GeV particle-beam measurements using a synchroscan and dual-sweep x-ray streak camera | Zendy

A.H. Lumpkin | Zendy; Bingxin Yang | Zendy

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First multi-GeV particle-beam measurements using a synchroscan and dual-sweep x-ray streak camera

Author(s) -

A.H. Lumpkin,

Bingxin Yang

Publication year - 1998

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.57001

Subject(s) - streak camera , physics , photocathode , optics , pinhole camera , beam (structure) , streak , pinhole (optics) , storage ring , particle beam , particle accelerator , advanced photon source , wavelength , photon , nuclear physics , laser , electron

Particle-beam characterizations of a multi-GeV storage ring beam have been done for the first time using a synchroscan and dual-sweep x-ray streak camera at the Advanced Photon Source (APS). The hard x-rays (2-20 keV) from a bending magnet source were imaged using an adjustable pinhole aperture. Both the horizontal size, σ x ~ 190 μ m, and bunch length, σ t ~ 28 ps, were measured simultaneously. The Au photocathode provides sensitivity from 10 eV to 10 keV covering the three orders of magnitude in wavelength from the UV to hard x-rays.

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