Open AccessWafer and bulk high-purity silicon trace element analysis at the Texas A&M University Nuclear Science Center
Author(s) -
Daniel James Van Dalsem
Publication year - 1998
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1063/1.56925
Subject(s) - silicon , center (category theory) , nuclear science , wafer , trace element , materials science , radiochemistry , nuclear physics , optoelectronics , chemistry , physics , metallurgy , crystallography
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom