Open AccessBeam monitors based on residual gas ionization
Author(s) -
Jean-Luc P. Vignet,
Rémy M. Anne,
Yvon Georget,
Robert E. Hue,
C. Tribouillard
Publication year - 1997
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.52280
Subject(s) - beam (structure) , beamline , atomic physics , bunches , anode , ionization , microchannel plate detector , laser beam quality , ion beam , materials science , cyclotron , residual , electron , ion , optics , physics , nuclear physics , electrode , laser , algorithm , quantum mechanics , laser beams , computer science
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