Resonant laser ablation: Mechanisms and applications | Zendy

James E. Anderson | Zendy; Todd M. Allen | Zendy; Aaron W. Garrett | Zendy; Chris G. Gill | Zendy; P. H. Hemberger | Zendy; Peter B. Kelly | Zendy; N. S. Nogar | Zendy

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Resonant laser ablation: Mechanisms and applications

Author(s) -

James E. Anderson,

Todd M. Allen,

Aaron W. Garrett,

Chris G. Gill,

P. H. Hemberger,

Peter B. Kelly,

N. S. Nogar

Publication year - 1997

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.52183

Subject(s) - laser ablation , ablation , materials science , thin film , laser , mass spectrometry , spectrometer , analytical chemistry (journal) , profiling (computer programming) , optoelectronics , optics , nanotechnology , chemistry , computer science , physics , environmental chemistry , engineering , aerospace engineering , chromatography , operating system

We will report on aspects of resonant laser ablation (RLA) behavior for a number of sample types: metals, alloys, thin films, zeolites and soil. The versatility of RLA is demonstrated, with results on a variety of samples and in several mass spectrometers. In addition, the application to depth profiling of thin films is described; absolute removal rates and detection limits are also displayed. A discussion of possible mechanisms for low-power ablation are presented.

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