Open AccessIn-plane micro-displacement measurement based on secondary diffraction
Author(s) -
Shengrun Liu,
Bin Xue,
Jirui Yu,
Guangzhou Xu,
Juan Lv,
Ying Cheng,
Jianfeng Yang
Publication year - 2020
Publication title -
aip advances
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5143339
Subject(s) - diffraction , pinhole (optics) , optics , displacement (psychology) , ring (chemistry) , plane (geometry) , fresnel diffraction , beam (structure) , materials science , physics , geometry , mathematics , chemistry , psychology , organic chemistry , psychotherapist
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