z-logo
open-access-imgOpen Access
4f imaging system method to determine optical properties of thin film magnetic material
Author(s) -
Nauval Franata,
Febie Permata Sari,
Lukman Hakim,
Arief Sudarmaji,
Handoyo Handoyo,
Djati Handoko
Publication year - 2019
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5141642
Subject(s) - diffraction , materials science , optics , thin film , interference (communication) , characterization (materials science) , physics , computer science , nanotechnology , computer network , channel (broadcasting)

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom