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Solubility limit and material properties of a κ-(AlxGa1−x)2O3 thin film with a lateral cation gradient on (00.1)Al2O3 by tin-assisted PLD
Author(s) -
Anna Hassa,
Chris Sturm,
Max Kneiß,
Daniel Splith,
Holger von Wenckstern,
Thorsten Schultz,
Norbert Koch,
Michael Lorenz,
Marius Grundmann
Publication year - 2020
Publication title -
apl materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.571
H-Index - 60
ISSN - 2166-532X
DOI - 10.1063/1.5141041
Subject(s) - materials science , orthorhombic crystal system , lattice constant , band gap , thin film , ellipsometry , refractive index , tin , analytical chemistry (journal) , dielectric , pulsed laser deposition , ternary operation , sapphire , optics , crystallography , diffraction , crystal structure , laser , nanotechnology , optoelectronics , chemistry , physics , programming language , chromatography , computer science , metallurgy

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