Quantitative electrostatic force measurement and characterization based on oscillation amplitude using atomic force microscopy | Zendy

Kesheng Wang | Zendy; Yijia Lu | Zendy; Jia Cheng | Zendy; Xiaoying Zhu | Zendy; Linhong Ji | Zendy

Open Access

Quantitative electrostatic force measurement and characterization based on oscillation amplitude using atomic force microscopy

Author(s) -

Kesheng Wang,

Yijia Lu,

Jia Cheng,

Xiaoying Zhu,

Linhong Ji

Publication year - 2020

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.5136332

Subject(s) - electrostatic force microscope , kelvin probe force microscope , voltage , oscillation (cell signaling) , non contact atomic force microscopy , amplitude , conductive atomic force microscopy , electrostatics , atomic force acoustic microscopy , vibration , characterization (materials science) , atomic force microscopy , force dynamics , mechanics , physics , classical mechanics , chemistry , nanotechnology , materials science , magnetic force microscope , optics , acoustics , quantum mechanics , mechanical engineering , biochemistry , magnetization , engineering , magnetic field

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