Detection of decoupled surface and bulk states in epitaxial orthorhombic SrIrO3 thin films | Zendy

Prescott E. Evans | Zendy; Takashi Komesu | Zendy; Le Zhang | Zendy; DingFu Shao | Zendy; Andrew J. Yost | Zendy; Shiv Kumar | Zendy; Eike F. Schwier | Zendy; K. Shimada | Zendy; Evgeny Y. Tsymbal | Zendy; Xia Hong | Zendy; P. A. Dowben | Zendy

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Detection of decoupled surface and bulk states in epitaxial orthorhombic SrIrO3 thin films

Author(s) -

Prescott E. Evans,

Takashi Komesu,

Le Zhang,

DingFu Shao,

Andrew J. Yost,

Shiv Kumar,

Eike F. Schwier,

K. Shimada,

Evgeny Y. Tsymbal,

Xia Hong,

P. A. Dowben

Publication year - 2020

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.5135941

Subject(s) - orthorhombic crystal system , materials science , condensed matter physics , epitaxy , thin film , surface states , electron diffraction , photoemission spectroscopy , electronic band structure , low energy electron diffraction , metastability , lattice constant , crystallography , x ray photoelectron spectroscopy , crystal structure , layer (electronics) , diffraction , nanotechnology , optics , nuclear magnetic resonance , chemistry , surface (topology) , physics , geometry , mathematics , organic chemistry

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