Genesis and evolution of extended defects: The role of evolving interface instabilities in cubic SiC | Zendy

Giuseppe Fisicaro | Zendy; Corrado Bongiorno | Zendy; Ioannis Deretzis | Zendy; Filippo Giannazzo | Zendy; Francesco La Via | Zendy; Fabrizio Roccaforte | Zendy; Marcin Zieliński | Zendy; Massimo Zimbone | Zendy; Antonino La Magna | Zendy

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Genesis and evolution of extended defects: The role of evolving interface instabilities in cubic SiC

Author(s) -

Giuseppe Fisicaro,

Corrado Bongiorno,

Ioannis Deretzis,

Filippo Giannazzo,

Francesco La Via,

Fabrizio Roccaforte,

Marcin Zieliński,

Massimo Zimbone,

Antonino La Magna

Publication year - 2020

Publication title -

applied physics reviews

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 5.084

H-Index - 66

ISSN - 1931-9401

DOI - 10.1063/1.5132300

Subject(s) - materials science , kinetic monte carlo , substrate (aquarium) , semiconductor , transistor , optoelectronics , silicon , condensed matter physics , stacking , epitaxy , grain boundary , semiconductor device , stacking fault , nanotechnology , engineering physics , voltage , monte carlo method , dislocation , electrical engineering , chemistry , layer (electronics) , microstructure , physics , composite material , mathematics , oceanography , engineering , metallurgy , statistics , organic chemistry , geology

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