Open AccessErratum: “Dielectric breakdown at sub-critical fields” [Appl. Phys. Lett. 113, 112901 (2018)]
Author(s) -
Zhou Zuo,
L. A. Dissado,
N. M. Chalashkanov,
S.J. Dodd,
Chenguo Yao
Publication year - 2019
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5130905
Subject(s) - dielectric , condensed matter physics , materials science , dielectric strength , physics , engineering physics , optoelectronics
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