Highly (001) oriented MnAl thin film fabricated on CoGa buffer layer
Author(s) -
Daiki Oshima,
Takeshi Kato,
Satoshi Iwata
Publication year - 2020
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5130452
Subject(s) - materials science , annealing (glass) , buffer (optical fiber) , layer (electronics) , substrate (aquarium) , hysteresis , anisotropy , perpendicular , thin film , magnetic hysteresis , magnetic anisotropy , composite material , magnetization , condensed matter physics , optics , nanotechnology , magnetic field , electrical engineering , oceanography , physics , geometry , mathematics , quantum mechanics , geology , engineering
5 nm- and 15 nm-thick (001) oriented MnAl films were fabricated on CoGa buffer layers with various thermal treatments. The insertion of the CoGa layer was effective to obtain the square out-of-plane hysteresis loop even in the MnAl thickness of 5 nm. Highly (001) oriented MnAl film was obtained by depositing Mn and Al on CoGa at a substrate temperature of 200°C followed by annealing at 500°C. The perpendicular magnetic anisotropy was estimated to be 7.4±0.2 and 8.5±0.4 Merg/cc for 5 nm- and 15 nm-thick MnAl, respectively. Lower anisotropy in 5 nm-thick MnAl may be due to the interdiffusion between the MnAl and CoGa layers.5 nm- and 15 nm-thick (001) oriented MnAl films were fabricated on CoGa buffer layers with various thermal treatments. The insertion of the CoGa layer was effective to obtain the square out-of-plane hysteresis loop even in the MnAl thickness of 5 nm. Highly (001) oriented MnAl film was obtained by depositing Mn and Al on CoGa at a substrate temperature of 200°C followed by annealing at 500°C. The perpendicular magnetic anisotropy was estimated to be 7.4±0.2 and 8.5±0.4 Merg/cc for 5 nm- and 15 nm-thick MnAl, respectively. Lower anisotropy in 5 nm-thick MnAl may be due to the interdiffusion between the MnAl and CoGa layers.
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