XFEL coherent diffraction imaging for weakly scattering particles using heterodyne interference | Zendy

ChiFeng Huang | Zendy; WeiHau Chang | Zendy; Ting-Kuo Lee | Zendy; Yasumasa Joti | Zendy; Yoshinori Nishino | Zendy; Takashi Kimura | Zendy; Akihiro Suzuki | Zendy; Yoshitaka Bessho | Zendy; Tsung-Tse Lee | Zendy; MeiChun Chen | Zendy; Shunmin Yang | Zendy; Y. Hwu | Zendy; Shih-Hsin Huang | Zendy; Po-Nan Li | Zendy; Peilin Chen | Zendy; Yung-Chieh Tseng | Zendy; Che Ma | Zendy; Tsui-Ling Hsu | Zendy; ChiHuey Wong | Zendy; Kensuke Tono | Zendy; Tetsuya Ishikawa | Zendy; Keng S. Liang | Zendy

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XFEL coherent diffraction imaging for weakly scattering particles using heterodyne interference

Author(s) -

ChiFeng Huang,

WeiHau Chang,

Ting-Kuo Lee,

Yasumasa Joti,

Yoshinori Nishino,

Takashi Kimura,

Akihiro Suzuki,

Yoshitaka Bessho,

Tsung-Tse Lee,

MeiChun Chen,

Shunmin Yang,

Y. Hwu,

Shih-Hsin Huang,

Po-Nan Li,

Peilin Chen,

Yung-Chieh Tseng,

Che Ma,

Tsui-Ling Hsu,

ChiHuey Wong,

Kensuke Tono,

Tetsuya Ishikawa,

Keng S. Liang

Publication year - 2020

Publication title -

aip advances

Language(s) - Uncategorized

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.5129406

Subject(s) - fluence , optics , diffraction , coherent diffraction imaging , scattering , physics , interference (communication) , nanoparticle , laser , materials science , free electron laser , nanotechnology , phase retrieval , electrical engineering , quantum mechanics , engineering , channel (broadcasting) , fourier transform

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