z-logo
open-access-imgOpen Access
In situ measurements of the structure and strain of a π-conjugated semiconducting polymer under mechanical load
Author(s) -
M. Aliouat,
S. Escoubas,
M.C. Benoudia,
Dmitriy Ksenzov,
David Duché,
Evangéline Bènevent,
Christine VidelotAckermann,
Jörg Ackermann,
Ο. Thomas,
Souren Grigorian
Publication year - 2020
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5127226
Subject(s) - materials science , polymer , ultimate tensile strength , composite material , optical microscope , substrate (aquarium) , conjugated system , diffraction , deformation (meteorology) , thin film , stress relaxation , stress (linguistics) , in situ , relaxation (psychology) , optics , nanotechnology , chemistry , scanning electron microscope , creep , psychology , social psychology , linguistics , oceanography , physics , philosophy , geology , organic chemistry

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom