In situ measurements of the structure and strain of a π-conjugated semiconducting polymer under mechanical load
Author(s) -
M. Aliouat,
S. Escoubas,
M.C. Benoudia,
Dmitriy Ksenzov,
David Duché,
Evangéline Bènevent,
Christine VidelotAckermann,
Jörg Ackermann,
Ο. Thomas,
Souren Grigorian
Publication year - 2020
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5127226
Subject(s) - materials science , polymer , ultimate tensile strength , composite material , optical microscope , substrate (aquarium) , conjugated system , diffraction , deformation (meteorology) , thin film , stress relaxation , stress (linguistics) , in situ , relaxation (psychology) , optics , nanotechnology , chemistry , scanning electron microscope , creep , psychology , social psychology , linguistics , oceanography , physics , philosophy , geology , organic chemistry
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom