Analysis of temperature dependent surface recombination properties
Author(s) -
Rebekka Eberle,
Andreas Fell,
Tim Niewelt,
Florian Schindler,
Martin C. Schubert
Publication year - 2019
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5123888
Subject(s) - materials science , wafer , recombination , photovoltaic system , temperature measurement , silicon , optoelectronics , solar cell , photoluminescence , carrier lifetime , temperature coefficient , computational physics , thermodynamics , composite material , physics , electrical engineering , chemistry , biochemistry , gene , engineering
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