Open AccessCharacterization of sputtered a-Si:H passivated silicon surface by temperature- and injection-dependent lifetime spectroscopy
Author(s) -
Krishna Singh,
Sourav Mandal,
Sonpal Singh,
Vamsi K. Komarala
Publication year - 2019
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5123819
Subject(s) - dangling bond , passivation , materials science , wafer , carrier lifetime , silicon , analytical chemistry (journal) , sputtering , plasma enhanced chemical vapor deposition , crystalline silicon , amorphous silicon , spectroscopy , thin film , optoelectronics , chemistry , nanotechnology , layer (electronics) , physics , quantum mechanics , chromatography
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