Open AccessAccurate contact and contactless methods for emitter sheet resistance testing of PV wafers
Author(s) -
Ferenc Korsós,
P. Tüttő,
Ilias Saegh,
K. Kis-Szabo,
A.L. Tóth
Publication year - 2019
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5123811
Subject(s) - wafer , sheet resistance , contact resistance , common emitter , materials science , wafer testing , electrical contacts , optoelectronics , electronic engineering , composite material , engineering , layer (electronics)
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