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An advanced LED-based setup enabling characterization of full-size modules at different temperatures and spectra
Author(s) -
Jonathan Govaerts,
Arvid van der Heide,
Monica Alemán,
Jef Poortmans
Publication year - 2019
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5123809
Subject(s) - characterization (materials science) , computer science , spectral line , materials science , physics , nanotechnology , astronomy

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