Open AccessDependence of coil sensitivity on sample thickness in inductively coupled photoconductance measurements
Author(s) -
Lachlan E. Black,
Erwin Kessels
Publication year - 2019
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5123807
Subject(s) - electromagnetic coil , calibration , materials science , wafer , sensitivity (control systems) , attenuation , optics , optoelectronics , physics , electronic engineering , quantum mechanics , engineering
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