Open AccessReconstruction the illumination pattern of the optical microscope to improve image fidelity obtained with the CR-39 detector
Author(s) -
Hazim G. Daway,
Iman Tarik Al-Alawy,
Saja Faez Hassan
Publication year - 2019
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5123076
Subject(s) - microscope , optics , detector , track (disk drive) , optical microscope , materials science , microscopy , light source , physics , optoelectronics , computer science , scanning electron microscope , operating system
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