GaN nanowires as probes for high resolution atomic force and scanning tunneling microscopy | Zendy

Sofie Yngman | Zendy; Filip Lenrick | Zendy; YenPo Liu | Zendy; Zhe Ren | Zendy; M. Khalilian | Zendy; B. Jonas Ohlsson | Zendy; Dan Hessman | Zendy; Lars Samuelson | Zendy; Rainer Timm | Zendy; Anders Mikkelsen | Zendy

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GaN nanowires as probes for high resolution atomic force and scanning tunneling microscopy

Author(s) -

Sofie Yngman,

Filip Lenrick,

YenPo Liu,

Zhe Ren,

M. Khalilian,

B. Jonas Ohlsson,

Dan Hessman,

Lars Samuelson,

Rainer Timm,

Anders Mikkelsen

Publication year - 2019

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.5122791

Subject(s) - nanowire , scanning probe microscopy , scanning tunneling microscope , materials science , scanning capacitance microscopy , scanning ion conductance microscopy , scanning electron microscope , conductive atomic force microscopy , scanning tunneling spectroscopy , microscopy , nanotechnology , electrochemical scanning tunneling microscope , optoelectronics , nanoprobe , spin polarized scanning tunneling microscopy , semiconductor , scanning confocal electron microscopy , optics , atomic force microscopy , nanoparticle , physics , composite material

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