Open AccessIn depth characterization of Ge-Si core-shell nanowires using X-ray coherent diffraction and time resolved pump-probe spectroscopy
Author(s) -
Sara Fernández,
Cyril Jean,
Éric Charron,
P. Gentile,
MarieIngrid Richard,
Ο. Thomas,
Bernard Perrin,
Laurent Belliard
Publication year - 2019
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5122263
Subject(s) - femtosecond , diffraction , nanowire , materials science , optics , ultrashort pulse , core (optical fiber) , spectroscopy , epitaxy , molecular physics , optoelectronics , laser , nanotechnology , chemistry , physics , layer (electronics) , quantum mechanics
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