Open AccessAccurate surface band bending determination on Ga-polar n-type GaN films by fitting x-ray valence band photoemission spectrum
Author(s) -
Zengli Huang,
Ying Wu,
Yanfei Zhao,
Lin Shi,
Rong Huang,
Fangsen Li,
Tong Liu,
Leilei Xu,
Hongwei Gao,
Yu Zhou,
Qian Sun,
Sunan Ding,
Ke Xu,
Hui Yang
Publication year - 2019
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5120324
Subject(s) - band bending , materials science , x ray photoelectron spectroscopy , doping , semimetal , analytical chemistry (journal) , surface states , electronic band structure , molecular physics , condensed matter physics , band gap , chemistry , surface (topology) , optoelectronics , nuclear magnetic resonance , physics , geometry , mathematics , chromatography
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