Open AccessProbing changes in secondary electron yield from copper electrodes due to surface defects and changes in crystal orientation
Author(s) -
H. K. Nguyen,
M. Sanati,
R. P. Joshi
Publication year - 2019
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5113642
Subject(s) - monte carlo method , materials science , electron , copper , annealing (glass) , secondary electrons , molecular physics , vacancy defect , electrode , condensed matter physics , atomic physics , chemistry , physics , metallurgy , mathematics , quantum mechanics , statistics