Open AccessThermal annealing induced structural, optical and electrical properties change in As40Se60-xBix chalcogenide thin films
Author(s) -
Mukta Behera,
N. C. Mishra,
Ramakanta Naik,
C. Sripan,
R. Ganesan
Publication year - 2019
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5111019
Subject(s) - materials science , annealing (glass) , chalcogenide , thin film , amorphous solid , raman spectroscopy , band gap , analytical chemistry (journal) , optoelectronics , optics , nanotechnology , crystallography , chemistry , composite material , physics , chromatography
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