Open AccessErratum: “Vacancy defects and optoelectrical properties for fluorine tin oxide thin films with various SnF2 contents” [J. Appl. Phys. 123, 025706 (2018)]
Author(s) -
Yawei Zhou,
Wenwu Xu,
Jingjing Li,
Chongshan Yin,
Yong Liu,
Bin Zhao,
Zhiquan Chen,
Chunqing He,
Wenfeng Mao,
Kenji Ito
Publication year - 2019
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5110975
Subject(s) - tin , vacancy defect , tin oxide , fluorine , materials science , thin film , oxide , condensed matter physics , nanotechnology , metallurgy , physics
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