Open AccessTransient dielectric functions of Ge, Si, and InP from femtosecond pump-probe ellipsometry
Author(s) -
Shirly Espinoza,
Steffen Richter,
Mateusz Rębarz,
Oliver Herrfurth,
Rüdiger SchmidtGrund,
Jakob Andreasson,
Stefan Zollner
Publication year - 2019
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5109927
Subject(s) - femtosecond , ellipsometry , refractive index , materials science , electron , laser , photon energy , dielectric , atomic physics , optics , optoelectronics , photon , thin film , physics , quantum mechanics , nanotechnology
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