Inversion channel mobility and interface state density of diamond MOSFET using N-type body with various phosphorus concentrations
Author(s) -
Tsubasa Matsumoto,
Hiromitsu Kato,
Toshiharu Makino,
Masahiko Ogura,
Daisuke Takeuchi,
Satoshi Yamasaki,
Takao Inokuma,
Norio Tokuda
Publication year - 2019
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5100328
Subject(s) - mosfet , diamond , materials science , electron mobility , field effect transistor , threshold voltage , optoelectronics , electric field , electrical resistivity and conductivity , transistor , wide bandgap semiconductor , analytical chemistry (journal) , condensed matter physics , voltage , chemistry , electrical engineering , physics , composite material , quantum mechanics , chromatography , engineering
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