A method for characterizing defects in multi-layer conductive structures by combining pulsed eddy current signals with PCA components | Zendy

Tianyu Ding | Zendy; Zhaohe Yang | Zendy; Hua Huang | Zendy; Pingjie Huang | Zendy; Dibo Hou | Zendy; Guangxin Zhang | Zendy

Open Access

A method for characterizing defects in multi-layer conductive structures by combining pulsed eddy current signals with PCA components

Author(s) -

Tianyu Ding,

Zhaohe Yang,

Hua Huang,

Pingjie Huang,

Dibo Hou,

Guangxin Zhang

Publication year - 2019

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.5099811

Subject(s) - principal component analysis , signal (programming language) , eddy current , time domain , computer science , support vector machine , electrical conductor , pattern recognition (psychology) , projection (relational algebra) , dimension (graph theory) , algorithm , layer (electronics) , signal processing , feature (linguistics) , artificial intelligence , materials science , mathematics , engineering , computer vision , telecommunications , electrical engineering , radar , pure mathematics , composite material , programming language , linguistics , philosophy

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