Open AccessInfrared-assisted acoustic emission process monitoring for additive manufacturing
Author(s) -
Yuri Plotnikov,
Dan Henkel,
Jeffrey Burdick,
Arthur French,
John Sions,
Keith A. Bourne
Publication year - 2019
Publication title -
aip conference proceedings
Language(s) - Uncategorized
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5099710
Subject(s) - acoustic emission , signal (programming language) , process (computing) , laser , computer science , infrared , acoustics , signal processing , thermography , nondestructive testing , materials science , energy (signal processing) , optics , computer hardware , physics , digital signal processing , quantum mechanics , programming language , operating system
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