Open AccessLow frequency fluctuation study using a microwave interferometer and Hα line emission measurement systems in the Pilot-PSI device
Author(s) -
Masayuki Yoshikawa,
H. van der Meiden,
R. Rajaraman,
J.W.M. Vernimmen,
J. Kohagura,
Y. Shima,
M. Sakamoto,
Y. Nakashima
Publication year - 2019
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5099648
Subject(s) - microwave , interferometry , physics , line (geometry) , emission spectrum , ionization , atomic physics , electron density , plasma , optics , ion , plasma diagnostics , electron , spectral line , geometry , mathematics , quantum mechanics , astronomy
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