Open AccessLongitudinal strain of epitaxial graphene monolayers on SiC substrates evaluated by z-polarization Raman microscopy
Author(s) -
Yuika Saito,
Kenshiro Tokiwa,
Takahiro Kondo,
Jianfeng Bao,
Tomoo Terasawa,
Wataru Norimatsu,
Michiko Kusunoki
Publication year - 2019
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5099430
Subject(s) - raman spectroscopy , graphene , materials science , monolayer , scanning electron microscope , microscopy , polarization (electrochemistry) , raman microscope , epitaxy , polarization microscopy , electron microscope , graphene nanoribbons , optoelectronics , analytical chemistry (journal) , raman scattering , nanotechnology , optics , chemistry , composite material , physics , layer (electronics) , chromatography
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