z-logo
open-access-imgOpen Access
Erratum: “Influence of the thickness of a nanometric copper interlayer on Au/dielectric thermal boundary conductance” [J. Appl. Phys. 124, 105304 (2018)]
Author(s) -
Maïté Blank,
L. Weber
Publication year - 2019
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5096856
Subject(s) - dielectric , copper , condensed matter physics , conductance , materials science , thermal conductivity , thermal , boundary (topology) , thermodynamics , composite material , physics , optoelectronics , metallurgy , mathematics , mathematical analysis

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom