Effects of substrate on the structure and properties of V2O5 thin films prepared by the sol-gel method | Zendy

Yaqiang Liu | Zendy; Qingqing Chen | Zendy; Xuelian Du | Zendy; Dage Liu | Zendy; Peng Li | Zendy

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Effects of substrate on the structure and properties of V2O5 thin films prepared by the sol-gel method

Author(s) -

Yaqiang Liu,

Qingqing Chen,

Xuelian Du,

Dage Liu,

Peng Li

Publication year - 2019

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.5095718

Subject(s) - materials science , pentoxide , raman spectroscopy , scanning electron microscope , orthorhombic crystal system , sol gel , thin film , vanadium , monoclinic crystal system , substrate (aquarium) , spin coating , chemical engineering , phase (matter) , annealing (glass) , analytical chemistry (journal) , crystallography , crystal structure , composite material , nanotechnology , optics , chemistry , metallurgy , organic chemistry , physics , oceanography , engineering , geology

Vanadium pentoxide (V2O5) thin films were prepared by sol-gel spin coating on Si and glass substrates. X-ray diffraction indicated that the annealed V2O5 film grown on Si substrate was a α-phase orthorhombic structure, while the annealed V2O5 film grown on glass substrates was a β-phase monoclinic structure. Raman spectroscopy revealed the formation of a V-O bond on both phase films. Scanning electron microscopy (SEM) showed that the annealed film on the Si substrate exhibited more uniform rod-like morphology compared with glass substrate film. Electrical measurements indicated the typical n-type semiconducting behavior of both annealed films coated on Si and glass substrates.Vanadium pentoxide (V2O5) thin films were prepared by sol-gel spin coating on Si and glass substrates. X-ray diffraction indicated that the annealed V2O5 film grown on Si substrate was a α-phase orthorhombic structure, while the annealed V2O5 film grown on glass substrates was a β-phase monoclinic structure. Raman spectroscopy revealed the formation of a V-O bond on both phase films. Scanning electron microscopy (SEM) showed that the annealed film on the Si substrate exhibited more uniform rod-like morphology compared with glass substrate film. Electrical measurements indicated the typical n-type semiconducting behavior of both annealed films coated on Si and glass substrates.

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