z-logo
open-access-imgOpen Access
Degradation analysis of 1 MeV electron and 3 MeV proton irradiated InGaAs single junction solar cell
Author(s) -
X. B. Shen,
Abuduwayiti Aierken,
M. Heini,
Jiacheng Mo,
Qi Lei,
Xiaofan Zhao,
Momin Sailai,
Yun Xu,
Mingsheng Tan,
Yuanyuan Wu,
S.L. Lu,
Y. D. Li,
Q. Guo
Publication year - 2019
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5094472
Subject(s) - solar cell , irradiation , materials science , proton , electron beam processing , carrier lifetime , optoelectronics , radiation damage , electron , degradation (telecommunications) , radiation , gallium arsenide , spectral line , silicon , optics , physics , electronic engineering , quantum mechanics , astronomy , nuclear physics , engineering

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom