Differential reflectance contrast technique in near field limit: Application to graphene | Zendy

L. F. LastrasMartínez | Zendy; D. Medina-Escobedo | Zendy; G. Flores-Rangel | Zendy; R. E. BalderasNavarro | Zendy; O. Ruiz-Cigarrillo | Zendy; R. Castro-García | Zendy; M. del P. Morales-Morelos | Zendy; J. OrtegaGallegos | Zendy; María Losurdo | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Differential reflectance contrast technique in near field limit: Application to graphene

Author(s) -

L. F. LastrasMartínez,

D. Medina-Escobedo,

G. Flores-Rangel,

R. E. BalderasNavarro,

O. Ruiz-Cigarrillo,

R. Castro-García,

M. del P. Morales-Morelos,

J. OrtegaGallegos,

María Losurdo

Publication year - 2019

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.5092339

Subject(s) - near field scanning optical microscope , graphene , materials science , optics , optical microscope , substrate (aquarium) , near and far field , micrometer , reflection (computer programming) , wavelength , layer (electronics) , microscopy , resolution (logic) , optoelectronics , nanotechnology , scanning electron microscope , physics , composite material , oceanography , artificial intelligence , geology , computer science , programming language

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research