Open AccessSimulation of sub-nm carrier profiling by scanning frequency comb microscopy
Author(s) -
Mark J. Hagmann,
Jeremy Wiedemeier
Publication year - 2019
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5092282
Subject(s) - materials science , scanning tunneling microscope , laser , harmonics , spin polarized scanning tunneling microscopy , microscopy , laser linewidth , biasing , optics , semiconductor , optoelectronics , scanning tunneling spectroscopy , voltage , physics , nanotechnology , quantum mechanics
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