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The article presents the results of Rthj-c thermal resistance tests for selected high power semiconductor light sources. The thermal resistance between the junction and the casing of semiconductor light sources is one of the key parameters determining the correct junction temperature of the LED sources and its influence on the basic light and electric parameters of semiconductor light sources. The tests were carried out in accordance with the international standard JEDEC JESD51-14 using the Mentor Graphics measuring equipment.

Research on thermal resistance Rthj-c of high power semiconductor light sources