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Identification of the mechanism responsible for the boron oxygen light induced degradation in silicon photovoltaic cells
Author(s) -
Michelle VaqueiroContreras,
В. П. Маркевич,
J. Coutinho,
P. Santos,
Iain F. Crowe,
Matthew P. Halsall,
I.D. Hawkins,
Stanislau B. Lastovskii,
Л. И. Мурин,
А. R. Peaker
Publication year - 2019
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5091759
Subject(s) - silicon , boron , photoluminescence , materials science , optoelectronics , deep level transient spectroscopy , oxygen , degradation (telecommunications) , chemical physics , auger effect , acceptor , band gap , carrier lifetime , photochemistry , chemistry , auger , atomic physics , electronic engineering , physics , condensed matter physics , organic chemistry , engineering

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