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Applications at the 3 MV TandetronTM from IFIN-HH
Author(s) -
I. Burducea,
A. Mitu,
A. Rotaru,
A. Rugină,
A. State,
A. Vasiliu,
B. Savu,
D. V. Moşu,
D. Iancu,
Dragoș Alexandru Mirea,
Doru Păceșilă,
Paul Mereuță,
Radu Andrei,
T. Sava,
M. Straticiuc
Publication year - 2019
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5091640
Subject(s) - context (archaeology) , scanning electron microscope , characterization (materials science) , evaporation , materials science , rutherford backscattering spectrometry , substrate (aquarium) , focused ion beam , elemental analysis , nanomaterials , thin film , nanotechnology , analytical chemistry (journal) , physics , ion , composite material , chemistry , geology , organic chemistry , paleontology , oceanography , chromatography , quantum mechanics , thermodynamics

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