Open AccessHigh voltage test system based on VR technology
Author(s) -
Yuzeng Yao
Publication year - 2019
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5089096
Subject(s) - computer science , software , test (biology) , process (computing) , voltage , electric power system , reliability engineering , software engineering , embedded system , simulation , power (physics) , engineering , operating system , electrical engineering , paleontology , physics , quantum mechanics , biology
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