Open AccessDetermination of the composition of an oxidized Tb0.32Dy0.67Fe1.92 thin film by anomalous x-ray scattering
Author(s) -
ChihHao Lee,
Wen-Ching Chang,
Aswin kumar Anbalagan
Publication year - 2019
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5084604
Subject(s) - materials science , scattering , lattice constant , diffraction , thin film , sputtering , x ray , annealing (glass) , analytical chemistry (journal) , sputter deposition , synchrotron radiation , x ray crystallography , stoichiometry , anomalous scattering , crystallography , optics , chemistry , physics , metallurgy , nanotechnology , chromatography
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