Open AccessStructural characterization of the LaInO3/BaSnO3 interface via synchrotron scattering
Author(s) -
Claudia Lau,
Youjung Kim,
Stephen D. Albright,
K. Char,
Charles Ahn,
F. J. Walker
Publication year - 2019
Publication title -
apl materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.571
H-Index - 60
ISSN - 2166-532X
DOI - 10.1063/1.5084058
Subject(s) - materials science , pulsed laser deposition , orthorhombic crystal system , thin film , epitaxy , doping , scattering , heterojunction , crystallography , condensed matter physics , layer (electronics) , optics , optoelectronics , crystal structure , nanotechnology , chemistry , physics
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