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Electrical contact uniformity and surface oxidation of ternary chalcogenide alloys
Author(s) -
Peter Anand Sharma,
Michael T. Brumbach,
David P. Adams,
Jon F. Ihlefeld,
Ana L. Lima-Sharma,
Stanley S. Chou,
J. D. Sugar,
Ping Lu,
Joseph R. Michael,
David Ingersoll
Publication year - 2019
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5081818
Subject(s) - x ray photoelectron spectroscopy , materials science , oxide , contact resistance , crystallite , ternary operation , substrate (aquarium) , etching (microfabrication) , layer (electronics) , bismuth telluride , electrical contacts , isotropic etching , metallurgy , composite material , chemical engineering , thermoelectric materials , thermal conductivity , oceanography , engineering , programming language , geology , computer science

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