Open AccessFocused ion beam and advanced electron microscopy for nano defect failure analysis of LED
Author(s) -
Rudi Gunawan,
Eni Sugiarti,
Isnaeni Isnaeni,
Ibrahim Purawiardi,
Henry Widodo,
Ahmad Novi Muslimin,
Yuliasari,
C. E. Ronaldus,
Niki Prastomo,
Sri Hastuty
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5080843
Subject(s) - focused ion beam , transmission electron microscopy , materials science , characterization (materials science) , nano , optoelectronics , ion beam , ion beam analysis , ion , nanostructure , nanotechnology , beam (structure) , optics , composite material , chemistry , physics , organic chemistry
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom