Characterization of multilayered structures by swept-frequency eddy current testing
Author(s) -
Weiying Cheng,
Hidetoshi Hashizume
Publication year - 2019
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5079959
Subject(s) - eddy current , frequency band , signal (programming language) , series (stratigraphy) , electrical conductor , acoustics , materials science , low frequency , reflection (computer programming) , equivalent series resistance , frequency response , characterization (materials science) , optics , physics , computer science , geology , telecommunications , electrical engineering , bandwidth (computing) , engineering , composite material , paleontology , quantum mechanics , voltage , programming language
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